Juin J. Liou
Juin J. Liou
Bookitis has not yet captured a biography for this author, but the catalog links below show the books currently associated with this profile.
Overview
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Catalog identity
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Featured books
Representative editions for works actually authored by this person.
- Image source: Open LibraryOE
On-Chip Electro-Static Discharge Protection for Radio-Frequency Integrated Circuits
cover - Image source: Open LibraryND
Nano Devices and Sensors
cover - Image source: Open LibraryED
Electrostatic Discharge Protection of Semiconductor Devices and Integrated Circuits
cover - Image source: Open LibraryNC
Nanometer CMOS
cover - Image source: Open LibraryMM
Modern microwave transistors
cover - Image source: Open LibraryAA
Analysis and design of MOSFETs
cover - Image source: Open LibraryPA
Principles and analysis of AlGaAs/GaAs heterojunction bipolar transistors
cover - Image source: Open LibraryAS
Advanced semiconductor device physics and modeling
cover - EDElectrostatic Discharge ProtectionJuin J. Liou
Electrostatic Discharge Protection
no cover - OEOn-Chip Electro-Static Discharg...Juin J. Liou
On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
no cover - SPSemiconductor Process Reliabili...Juin J. Liou
Semiconductor Process Reliability in Practice
no cover - NCNanometer CMOSJuin J. Liou
Nanometer CMOS
no cover
Works in catalog
Quick navigation into the work-level grouping pages behind the featured books.
- Open Work
On-Chip Electro-Static Discharge Protection for Radio-Frequency Integrated Circuits
- Open Work
Nano Devices and Sensors
- Open Work
Electrostatic Discharge Protection of Semiconductor Devices and Integrated Circuits
- Open Work
Nanometer CMOS
- Open Work
Modern microwave transistors
- Open Work
Analysis and design of MOSFETs
- Open Work
Principles and analysis of AlGaAs/GaAs heterojunction bipolar transistors
- Open Work
Advanced semiconductor device physics and modeling
- Open Work
Electrostatic Discharge Protection
- Open Work
On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
- Open Work
Semiconductor Process Reliability in Practice
- Open Work
Nanometer CMOS
