International Conference on Defect Recognition and Image Processing in Semiconductors (7th 1997 Templin, Germany)

Author detail

1 featured book

Bookitis has not yet captured a biography for this author, but the catalog links below show the books currently associated with this profile.

OL403157A

Overview

Catalog identity and bibliographic footprint for this author.

1 representative edition

Author pages in Bookitis are intended to show only works actually attributed to the author and a representative edition for each of those works.

How this author appears inside the active Bookitis catalog.

Display name
International Conference on Defect Recognition and Image Processing in Semiconductors (7th 1997 Templin, Germany)
Source identifier
OL403157A

Representative editions for works actually authored by this person.

Quick navigation into the work-level grouping pages behind the featured books.

Defect recognition and image processing in semiconductors 1997
Representative edition published 1998
Open Work