Test and diagnosis of analogue, mixed-signal and RF integrated circuits

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Test and diagnosis of analogue, mixed-signal and RF integrated circuits

Yichuang Sun

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Yichuang SunPublished 2008cover on file

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Publisher	Institution of Engineering and Technology
Format	[electronic resource] :
Search language	english
ISBN_10	1-615-83315-3 primary
ISBN_13	978-1-615-83315-3 primary

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Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits
Yichuang Sun | Institution of Engineering & Technology | 2008