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Leo Beiser
Written by an award-winning leader in the field, this is a thoroughly integrated overview of the many facets and disciplines of optical scanning. Of particular utility to both practitioner and student are such features as: An overview of the technology and unifying principles, including active and passive scanning, optical transfer, and system architecture In-depth chapters on scanning theory and processes, scanned resolution, scanner devices and techniques, and the control of scanner beam misplacemen A comprehensive review of the government-sponsored research of agile beam steering, now primed for commercial adaptation A unique focus on the Lagrange invariant and its revealing resolution invariant
| Publisher | Wiley & Sons, Incorporated, John |
|---|---|
| Pages | 185 |
| Search language | english |
| ISBN_13 | 978-0-470-31080-9 primary |
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Unified Optical Scanning Technology
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Unified optical scanning technology