Loading edition detail...
Preparing this view.
Join BookitisSave favorites, build lists, and follow creators.
Preparing this view.
Alfred Stein, John Shi, Wietske Bijker
This page shows the publication-specific record: publisher, date, identifiers, and all of the context needed to decide whether this is the copy you want.
| Publisher | CRC, CRC Press |
|---|---|
| Pages | 374 |
| Format | Hardcover |
| Search language | english |
| ISBN_10 | 1-420-06926-8 primary |
| ISBN_13 | 978-1-420-06926-6 primary |
Publication-specific alternatives linked to the same work.
Quality Aspects in Spatial Data Mining
Quality Aspects in Spatial Data Mining
Quality Aspects in Spatial Data Mining
Quality Aspects in Spatial Data Mining
Quality aspects in spatial data mining
Quality aspects in spatial data mining
Quality Aspects in Spatial Data Mining