Loading edition detail...
Preparing this view.
Join BookitisSave favorites, build lists, and follow creators.
Preparing this view.
International Workshop on Beam Injection Assessment of Defects in Semiconductors (5th 1998 Berlin, Germany)
This page shows the publication-specific record: publisher, date, identifiers, and all of the context needed to decide whether this is the copy you want.
| Publisher | Scitec |
|---|---|
| Pages | 537 |
| Search language | english |
| ISBN_10 | 3-908-45039-X primary |
Publication-specific alternatives linked to the same work.