Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics - 2004

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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics - 2004

R. J. Carter, C. S. Hau-Riege, G. M. Kloster, T. -M Lu, S. E. Schulz

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Materials, Technology and Reliability for Advanced Interconnec...R. J. Carter, C. S. Hau-Riege, G. M. Kloster, T. -M Lu, S. E. Schulz

R. J. Carter, C. S. Hau-Riege, G. M. Kloster, T. -M Lu, S. E. SchulzPublished 20141 title views

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Publisher	University of Cambridge ESOL Examinations
Pages	422
Search language	english
ISBN_13	978-1-107-40922-4 primary

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Image source: Open Library
Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics--2004
R. J. Carter | Materials Research Society | January 2004
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MT
Image source: Open Library
Materials, technology, and reliability for advanced interconnects and low-k dielectrics--2004
Materials Research Society | 2004