Metrology and Standardization for Nanotechnology

Loading edition detail...

Preparing this view.

Metrology and Standardization for Nanotechnology

Elisabeth Mansfield, Daisuke Fujita, Debra L. Kaiser, Marcel Van de Voorde

Bookitis Pick

Cover for Metrology and Standardization for Nanotechnology

Image source: Open Library

Elisabeth Mansfield, Daisuke Fujita, Debra L. Kaiser, Marcel Van de VoordePublished 2017cover on file

This page shows the publication-specific record: publisher, date, identifiers, and all of the context needed to decide whether this is the copy you want.

Main catalog entry More like this

Publisher	Wiley-VCH Verlag GmbH
Pages	626
Search language	english
ISBN_13	978-3-527-34039-2 primary

Other editions of this title

Publication-specific alternatives linked to the same work.

Metrology and Standardization f...Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, Marcel Van de Voorde
MA
Metrology and Standardization for Nanotechnology
Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, Marcel Van de Voorde | Wiley & Sons, Incorporated, John | 2017
Metrology and Standardization f...Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, Marcel Van de Voorde
MA
Metrology and Standardization for Nanotechnology
Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, Marcel Van de Voorde | Wiley & Sons, Incorporated, John | 2017
Metrology and Standardization f...Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, Marcel Van de Voorde
MA
Metrology and Standardization for Nanotechnology
Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, Marcel Van de Voorde | Wiley & Sons, Incorporated, John | 2017
Metrology and Standardization f...Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, Marcel Van de Voorde
MA
Metrology and Standardization for Nanotechnology
Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, Marcel Van de Voorde | Wiley & Sons, Limited, John | 2017
Metrology and Standardization f...Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, Marcel Van de Voorde
MA
Metrology and Standardization for Nanotechnology
Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, Marcel Van de Voorde | Wiley & Sons, Incorporated, John | 2017