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Y. C. Lee
This book provides a single source reference that addresses both advanced packaging and manufacturing activities, enhanced by reviews and in-depth analysis. The common theme throughout the book is how to manufacture with only one defective package in a million escaping undetected. The book will become the most important reference for professionals who need to meet this goal through their design and manufacturing activities.
| Publisher | Springer US |
|---|---|
| Pages | 261 |
| Format | [electronic resource] / |
| Search language | english |
| ISBN_10 | 1-461-37659-9 primary |
| ISBN_10 | 1-461-55803-4 primary |
| ISBN_13 | 978-1-461-37659-0 primary |
| ISBN_13 | 978-1-461-55803-3 primary |
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