Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Sandeep K. Goel, Krishnendu Chakrabarty

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Testing for Small-Delay Defects in Nanoscale CMOS Integrated C...Sandeep K. Goel, Krishnendu Chakrabarty

Sandeep K. Goel, Krishnendu ChakrabartyPublished 20171 title views

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Publisher	Taylor & Francis Group
Pages	259
Search language	english
ISBN_13	978-1-138-07577-1 primary

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Image source: Open Library
Testing For Smalldelay Defects In Nanoscale Cmos Integrated Circuits
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Testing for Small-Delay Defects...Sandeep K. Goel, Krishnendu Chakrabarty
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Sandeep K. Goel, Krishnendu Chakrabarty | Taylor & Francis Group | 2017
Testing for Small-Delay Defects...Sandeep K. Goel, Krishnendu Chakrabarty
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Testing for Small-Delay Defects...Sandeep K. Goel
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