Structural, Syntactic, and Statistical Pattern Recognition

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Structural, Syntactic, and Statistical Pattern Recognition

Xiao Bai, Edwin R. Hancock, Tin Kam Ho, Richard C. Wilson, Battista Biggio, Antonio Robles-Kelly

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Xiao Bai, Edwin R. Hancock, Tin Kam Ho, Richard C. Wilson, Battista Biggio, Antonio Robles-KellyPublished Aug 02, 2018cover on file

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Publisher	Springer
Pages	537
Format	paperback
Search language	english
ISBN_10	3-319-97784-9 primary
ISBN_13	978-3-319-97784-3 primary

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