Loading edition detail...
Preparing this view.
Join BookitisSave favorites, build lists, and follow creators.
Preparing this view.
D. Keith Bowen, B. K. Tanner
This page shows the publication-specific record: publisher, date, identifiers, and all of the context needed to decide whether this is the copy you want.
| Publisher | Taylor & Francis Group |
|---|---|
| Search language | english |
| ISBN_13 | 978-0-367-40063-7 primary |
Publication-specific alternatives linked to the same work.
High Resolution X-Ray Diffractometry and Topography
High Resolution X-Ray Diffractometry and Topography
High Resolution X-Ray Diffractometry and Topography
High Resolution X-Ray Diffractometry and Topography
High Resolution X-Ray Diffractometry and Topography
High Resolution X-Ray Diffractometry and Topography