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IEEE International Conference on Microelectronic Test Structures (1999 Göteborg, Sweden)
This page shows the publication-specific record: publisher, date, identifiers, and all of the context needed to decide whether this is the copy you want.
| Publisher | Institute of Electrical and Electronics Engineers |
|---|---|
| Pages | 235 |
| Search language | simple |
| ISBN_10 | 0-780-35270-X primary |
| ISBN_10 | 0-780-35271-8 primary |
| ISBN_10 | 0-780-35272-6 primary |
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