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Louay A. Eldada, Michael J. Heben
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
| Publisher | SPIE |
|---|---|
| Search language | english |
| ISBN_10 | 0-819-49673-1 primary |
| ISBN_13 | 978-0-819-49673-7 primary |
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