Proceedings of the Second International Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing

Loading edition detail...

Preparing this view.

Proceedings of the Second International Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing

International Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing (2nd 1997 Montréal, Québec)

Bookitis Pick

Cover for Proceedings of the Second International Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing

Image source: Open Library

International Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing (2nd 1997 Montréal, Québec)Published 1997cover on file

This page shows the publication-specific record: publisher, date, identifiers, and all of the context needed to decide whether this is the copy you want.

Main catalog entry More like this

Publisher	Electrochemical Society
Pages	347
Search language	english
ISBN_10	1-566-77136-6 primary

Other editions of this title

Publication-specific alternatives linked to the same work.

No other linked editions are currently available for this work in the active snapshot.