Characterization, Testing, Measurement, and Metrology

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Characterization, Testing, Measurement, and Metrology

Chander Prakash, Sunpreet Singh, J. Paulo Davim

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Characterization, Testing, Measurement, and MetrologyChander Prakash, Sunpreet Singh, J. Paulo Davim

Chander Prakash, Sunpreet Singh, J. Paulo DavimPublished 20201 title views

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Publisher	Taylor & Francis Group
Pages	192
Search language	english
ISBN_13	978-0-429-29807-3 primary

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Characterization, Testing, Meas...Chander Prakash, Sunpreet Singh, J. Paulo Davim
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Characterization, Testing, Measurement, and Metrology
Chander Prakash, Sunpreet Singh, J. Paulo Davim | Taylor & Francis Group | 2020