Loading edition detail...
Preparing this view.
International Symposium on Advanced Gate Stack, Source/Drain and Channel Engineering for Si-based CMOS (3rd 2007 Chicago, Ill.)
This page shows the publication-specific record: publisher, date, identifiers, and all of the context needed to decide whether this is the copy you want.
| Publisher | Electrochemical Society |
|---|---|
| Pages | 470 |
| Search language | english |
| ISBN_13 | 978-1-566-77550-2 primary |
Publication-specific alternatives linked to the same work.