Scanning Electron Microscopy and X-Ray Microanalysis

Loading edition detail...

Preparing this view.

Scanning Electron Microscopy and X-Ray Microanalysis

Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy

Bookitis Pick

Cover for Scanning Electron Microscopy and X-Ray Microanalysis

Image source: Open Library

Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. JoyPublished Aug 30, 2018cover on file

This page shows the publication-specific record: publisher, date, identifiers, and all of the context needed to decide whether this is the copy you want.

Main catalog entry More like this

Publisher	Springer
Pages	573
Format	paperback
Search language	english
ISBN_10	1-493-98269-9 primary
ISBN_13	978-1-493-98269-1 primary

Other editions of this title

Publication-specific alternatives linked to the same work.

SE
Image source: Open Library
Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein | Springer US | 1992
Scanning Electron Microscopy an...Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy
SE
Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy | Springer | 2018