Loading edition detail...
Preparing this view.
Join BookitisSave favorites, build lists, and follow creators.
Preparing this view.
Bryan Gardiner, Pancham Singh, Prashant Upadhyay, Meetu Malhotra, Rahul Sharma
This page shows the publication-specific record: publisher, date, identifiers, and all of the context needed to decide whether this is the copy you want.
| Publisher | IGI Global Scientific Publishing |
|---|---|
| Pages | 428 |
| Search language | english |
| ISBN_13 | 979-8-337-34462-1 primary |
Publication-specific alternatives linked to the same work.
Automating Software Defect Detection Through Machine Learning and LLMs
Automating Software Defect Detection Through Machine Learning and LLMs
Automating Software Defect Detection Through Machine Learning and LLMs
Automating Software Defect Detection Through Machine Learning and LLMs