VLSI Test Principles and Architectures

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VLSI Test Principles and Architectures

Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

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Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing WenPublished July 7, 2006cover on file

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Publisher	Morgan Kaufmann
Pages	808
Search language	french
ISBN_13	978-0-123-70597-6 primary
ISBN_10	0-123-70597-5 primary

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VT
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VLSI test principles and architectures
Elsevier Morgan Kaufmann Publishers, Morgan Kaufmann | 2006
VLSI Test Principles and Archit...Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen, Khader S. Abdel-Hafez, Soumendu Bhattacharya
VT
VLSI Test Principles and Architectures
Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen, Khader S. Abdel-Hafez, Soumendu Bhattacharya | Elsevier Science & Technology Books | 2006