Loading edition detail...
Preparing this view.
IEEE International Workshop on Memory Technology, Design and Testing (10th 2002 Isle of Bendor, France)
This page shows the publication-specific record: publisher, date, identifiers, and all of the context needed to decide whether this is the copy you want.
| Publisher | Ieee Computer Society |
|---|---|
| Pages | 182 |
| Search language | english |
| ISBN_10 | 0-769-51618-1 primary |
| ISBN_10 | 0-769-51619-X primary |
| ISBN_10 | 0-769-51617-3 primary |
Publication-specific alternatives linked to the same work.