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Dror Sarid
This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the.
| Edition | 2nd completely rev. and enl. ed. |
|---|---|
| Publisher | Wiley-VCH |
| Pages | 310 |
| Format | [electronic resource] / |
| Search language | english |
| ISBN_10 | 3-527-60987-3 primary |
| ISBN_13 | 978-3-527-60987-1 primary |
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