Electron beam ion sources and traps and their applications

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Electron beam ion sources and traps and their applications

International Symposium on Electron Beam Ion Sources and Traps and their Applications (8th 2000 Upton, N.Y.)

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International Symposium on Electron Beam Ion Sources and Traps and their Applications (8th 2000 Upton, N.Y.)Published 2001cover on file

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Publisher	American Institute of Physics
Pages	304
Search language	english
ISBN_10	0-735-40011-3 primary

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