Fundamentals of Electromigration-Aware Integrated Circuit Design

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Fundamentals of Electromigration-Aware Integrated Circuit Design

Jens Lienig, Matthias Thiele

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Jens Lienig, Matthias ThielePublished Mar 07, 2018cover on file

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Publisher	Springer
Pages	172
Format	hardcover
Search language	english
ISBN_10	3-319-73557-8 primary
ISBN_13	978-3-319-73557-3 primary

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