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Williams, David B.
This volume reviews current research in the field of X-ray spectrometry and its relationship to the practice of electron probe X-ray microanalysis.
| Publisher | Springer US, Springer |
|---|---|
| Pages | 390 |
| Format | [electronic resource] / |
| Search language | english |
| ISBN_10 | 1-461-51825-3 primary |
| ISBN_13 | 978-1-461-51825-9 primary |
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