Join BookitisSave favorites, build lists, and follow creators.
Log InCreate Account

Proceedings of the Symposium on Contamination Control and Defect Reduction in Semiconductor Manufacturing III

Work detail

Bookitis Pick
Cover for Proceedings of the Symposium on Contamination Control and Defect Reduction in Semiconductor Manufacturing III
PO
Image source: Open Library
Symposium on Contamination Control and Defect Reduction in Semiconductor Manufacturing (3rd 1994 San Francisco, Calif.)First published 19941 editions

This page groups all known editions belonging to the same underlying work.

Search booksOpen lead author

Overview

Shared work-level identity and catalog context.

First publish date 19941 credited authorSearch language english

Bookitis keeps work pages focused on the shared book identity and the editions that actually belong to it. Unrelated books should not appear here as primary content.

Contributors

People credited with this work in the active catalog.

  • Symposium on Contamination Control and Defect Reduction in Semiconductor Manufacturing (3rd 1994 San Francisco, Calif.)

    Author profile in the active Bookitis catalog

    Open Author

Editions

Publication-specific versions linked to this work only.