Power-constrained testing of VLSI circuits

Work detail

Bookitis Pick

Cover for Power-constrained testing of VLSI circuits

Image source: Open Library

Nicola NicoliciBashir M. Al-Hashimi3 editions

This page groups all known editions belonging to the same underlying work.

Search books Open lead author

Overview

Shared work-level identity and catalog context.

2 credited authorsSearch language english

Bookitis keeps work pages focused on the shared book identity and the editions that actually belong to it. Unrelated books should not appear here as primary content.

Contributors

People credited with this work in the active catalog.

Nicola Nicolici
Author profile in the active Bookitis catalog
Open Author
Bashir M. Al-Hashimi
Author profile in the active Bookitis catalog
Open Author

Editions

Publication-specific versions linked to this work only.

PT
Image source: Open Library
Power-Constrained Testing of Vlsi Circuits
Nicola Nicolici | Springer | Dec 09, 2010
1 views
PT
Image source: Open Library
Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)
Nicola Nicolici, Bashir M. Al-Hashimi | Springer | February 28, 2003
Power-Constrained Testing of VL...Nicola Nicolici, Bashir M. Al-Hashimi
PT
Power-Constrained Testing of VLSI Circuits
Nicola Nicolici, Bashir M. Al-Hashimi | Springer London, Limited | 2006