Join BookitisSave favorites, build lists, and follow creators.
Log InCreate Account

Proceedings of the 18th International Conference on Defects in Semiconductors

Work detail

Bookitis Pick
Cover for Proceedings of the 18th International Conference on Defects in Semiconductors
PO
Image source: Open Library
International Conference on Defects in Semiconductors (18th 1995 Sendai, Japan)First published 19952 editions

This page groups all known editions belonging to the same underlying work.

Search booksOpen lead author

Overview

Shared work-level identity and catalog context.

First publish date 19951 credited authorSearch language english

Bookitis keeps work pages focused on the shared book identity and the editions that actually belong to it. Unrelated books should not appear here as primary content.

Contributors

People credited with this work in the active catalog.

  • International Conference on Defects in Semiconductors (18th 1995 Sendai, Japan)

    Author profile in the active Bookitis catalog

    Open Author

Editions

Publication-specific versions linked to this work only.