Join BookitisSave favorites, build lists, and follow creators.
Log InCreate Account

Memory technology, design and testing

Work detail

Bookitis Pick
Cover for Memory technology, design and testing
MT
Image source: Open Library
IEEE International Workshop on Memory Technology, Design, and Testing (1998 San Jose, California)First published 19982 editions

This page groups all known editions belonging to the same underlying work.

Search booksOpen lead author

Overview

Shared work-level identity and catalog context.

First publish date 19981 credited authorSearch language english

Bookitis keeps work pages focused on the shared book identity and the editions that actually belong to it. Unrelated books should not appear here as primary content.

Contributors

People credited with this work in the active catalog.

  • IEEE International Workshop on Memory Technology, Design, and Testing (1998 San Jose, California)

    Author profile in the active Bookitis catalog

    Open Author

Editions

Publication-specific versions linked to this work only.