Defect and fault tolerance in VLSI systems

Work detail

Bookitis Pick

Defect and fault tolerance in VLSI systems

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1998 Austin, Tex.)First published 19981 editions

This page groups all known editions belonging to the same underlying work.

Search books Open lead author

Overview

Shared work-level identity and catalog context.

First publish date 19981 credited authorSearch language english

Bookitis keeps work pages focused on the shared book identity and the editions that actually belong to it. Unrelated books should not appear here as primary content.

Contributors

People credited with this work in the active catalog.

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1998 Austin, Tex.)
Author profile in the active Bookitis catalog
Open Author

Editions

Publication-specific versions linked to this work only.

Defect and fault tolerance in V...IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1998 Austin, Tex.)
DA
Defect and fault tolerance in VLSI systems
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1998 Austin, Tex.) | IEEE Computer Society Press | 1998