Bookitis
Join BookitisSave favorites, build lists, and follow creators.
Log InCreate Account

Proceedings, 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Work detail

Bookitis Pick
Cover for Proceedings, 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
P2
Image source: Open Library
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.First published 20001 editions

This page groups all known editions belonging to the same underlying work.

Search booksOpen lead author

Overview

Shared work-level identity and catalog context.

First publish date 20001 credited authorSearch language english

Bookitis keeps work pages focused on the shared book identity and the editions that actually belong to it. Unrelated books should not appear here as primary content.

Contributors

People credited with this work in the active catalog.

  • IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

    Author profile in the active Bookitis catalog

    Open Author

Editions

Publication-specific versions linked to this work only.