Advanced Scanning Electron Microscopy and X-Ray Microanalysis

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C. E. FioriJoseph GoldsteinDale E. NewburyPatrick EchlinDavid C. Joy1 editions

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5 credited authorsSearch language english

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C. E. Fiori
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Joseph Goldstein
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Dale E. Newbury
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Patrick Echlin
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David C. Joy
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Springer US | 1986