Sixteenth annual IEEE Semiconductor Thermal Measurement and Management Symposium
Work detail
Bookitis Pick
SA
Image source: Open LibraryInstitute of Electrical and Electronics EngineersIEEE Components Packaging & ManufacturinIEEE Semiconductor Thermal Measurement and Management Symposium.First published 20002 editions
This page groups all known editions belonging to the same underlying work.
Overview
Shared work-level identity and catalog context.
First publish date 20003 credited authorsSearch language english
Contributors
People credited with this work in the active catalog.
- Open Author
Institute of Electrical and Electronics Engineers
- Open Author
IEEE Components Packaging & Manufacturin
- Open Author
IEEE Semiconductor Thermal Measurement and Management Symposium.
Editions
Publication-specific versions linked to this work only.