Manoj Sachdev

MS

8 featured booksManoj Sachdev

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OL398968A

Featured books

Representative editions for works actually authored by this person.

DT
Image source: Open Library
Defect-oriented testing for nano-metric CMOS VLSI circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits | 2010
Representative edition for this work grouping in the active catalog.
cover
TA
Image source: Open Library
Thermal and Power Management of Integrated Circuits
Thermal and Power Management of Integrated Circuits | 2010
Representative edition for this work grouping in the active catalog.
cover
EP
Image source: Open Library
ESD protection device and circuit design for advanced CMOS technologies
ESD protection device and circuit design for advanced CMOS technologies | 2008
Representative edition for this work grouping in the active catalog.
cover
TA
Image source: Open Library
Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems)
Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems) | 2006
Representative edition for this work grouping in the active catalog.
cover
TA
Image source: Open Library
Thermal and Power Management of Integrated Circuits
Thermal and Power Management of Integrated Circuits (Series on Integrated Circuits and Systems) | 2006
Representative edition for this work grouping in the active catalog.
cover
2I
Image source: Open Library
2000 IEEE International Workshop on Defect Based Testing
2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada | 2000
Representative edition for this work grouping in the active catalog.
cover
DO
Image source: Open Library
Defect oriented testing for CMOS analog and digital circuits
Defect oriented testing for CMOS analog and digital circuits | 1998
Representative edition for this work grouping in the active catalog.
cover
CMOS SRAM Circuit Design and Pa...Manoj Sachdev
CS
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies | 2010
Representative edition for this work grouping in the active catalog.
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Works in catalog

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Defect-oriented testing for nano-metric CMOS VLSI circuits
Representative edition published 2010
Open Work
Thermal and Power Management of Integrated Circuits
Representative edition published 2010
Open Work
ESD protection device and circuit design for advanced CMOS technologies
Representative edition published 2008
Open Work
Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems)
Representative edition published 2006
Open Work
Thermal and Power Management of Integrated Circuits
Representative edition published 2006
Open Work
2000 IEEE International Workshop on Defect Based Testing
Representative edition published 2000
Open Work
Defect oriented testing for CMOS analog and digital circuits
Representative edition published 1998
Open Work
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Representative edition published 2010
Open Work

Manoj Sachdev

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Featured books

Works in catalog