Defect-oriented testing for nano-metric CMOS VLSI circuits

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José Pineda de GyvezManoj Sachdev3 editions

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José Pineda de Gyvez
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Manoj Sachdev
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DT
Image source: Open Library
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Manoj Sachdev, José Pineda de Gyvez | Springer | Nov 10, 2010
DT
Image source: Open Library
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
Manoj Sachdev, José Pineda de Gyvez | Springer | June 21, 2007
Defect-Oriented Testing for Nan...Manoj Sachdev, José Pineda de Gyvez
DT
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Manoj Sachdev, José Pineda de Gyvez | Springer London, Limited | 2007