Journey to Data Quality

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Journey to Data Quality

Yang W. Lee

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Journey to Data QualityYang W. Lee

Yang W. LeePublished 2006

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Publisher	MIT Press
Search language	english
ISBN_13	978-1-429-41614-6 primary

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JT
Image source: Open Library
Journey to Data Quality
Yang W. Lee, Leo L. Pipino, James D. Funk, Richard Y. Wang, Y. Lee | MIT Press, The MIT Press | 2009
JT
Image source: Open Library
Journey to data quality
MIT Press | 2006
Journey to Data QualityYang W. Lee, James D. Funk, Leo L. Pipino, Richard Y. Wang
JT
Journey to Data Quality
Yang W. Lee, James D. Funk, Leo L. Pipino, Richard Y. Wang | MIT Press | 2018
Journey to Data QualityLeo L. Pipino, Richard Y. Wang, James D. Funk, Yang W. Lee
JT
Journey to Data Quality
Leo L. Pipino, Richard Y. Wang, James D. Funk, Yang W. Lee | MIT Press | 2009
Journey to Data QualityLeo L. Pipino, Richard Y. Wang, James D. Funk, Yang W. Lee
JT
Journey to Data Quality
Leo L. Pipino, Richard Y. Wang, James D. Funk, Yang W. Lee | MIT Press | 2009