Journey to Data Quality

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Journey to Data Quality

Yang W. Lee, James D. Funk, Leo L. Pipino, Richard Y. Wang

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Journey to Data QualityYang W. Lee, James D. Funk, Leo L. Pipino, Richard Y. Wang

Yang W. Lee, James D. Funk, Leo L. Pipino, Richard Y. WangPublished 20181 title views

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Publisher	MIT Press
Pages	240
Search language	english
ISBN_13	978-0-262-25654-4 primary

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Journey to Data QualityYang W. Lee
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Image source: Open Library
Journey to Data Quality
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Image source: Open Library
Journey to data quality
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Journey to Data Quality
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