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II
author
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (22nd 2007 Rome, Italy)
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IA
author
International Autumn Meeting "Gettering and Defect Engineering in Semiconductor Technology" (12th 2007 Erice, Italy)
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0
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ES
author
European Symposium on Elastic-Plastic Fracture Mechanics: Elements of Defect Assessment (1989 Freiburg, Germany)
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IW
author
International Workshop on Defect and Fault Tolerance in VLSI Systems (1992 Dallas, Tex.)
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II
author
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1998 Austin, Tex.)
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II
author
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1999 Albuquerque, N.M.)
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II
author
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.
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IW
author
International Workshop on Defect and Fault Tolerance in VLSI Systems (1993 Venice, Italy)
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II
author
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2001 San Francisco, Calif.)
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II
author
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (21st 2006 Arlington, Virginia, USA)
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YC
author
Yamada Conference on Point Defects and Defect Interactions in Metals (1981 Kyoto)
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II
author
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (17th 2002 Vancouver, B.C.)
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CO
author
Conference on Point Defect Behaviour and Diffusional Processes Bristol 1976.
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JI
author
Japan) IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2010 Kyoto
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GI
author
Germany) International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin
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IC
author
International Conference on Defect Recognition and Image Processing in Semiconductors (7th 1997 Templin, Germany)
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SO
author
Symposium on Contamination Control and Defect Reduction in Semiconductor Manufacturing (3rd 1994 San Francisco, Calif.)
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SO
author
Symposium on Contamination Control and Defect Reduction in Semiconductor Manufacturing (2nd 1993 Honolulu, Hawaii)
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0
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EI
author
England) International Symposium on Defect Recognition and Image Processing in III-V Compounds (4th : 1991 : Wilmslow
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IS
author
International Symposium on Defect Recognition and Image Processing in III-V Compounds (4th 1991 Wilmslow, England)
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SO
author
Symposium on Contamination Control and Defect Reduction in Semiconductor Manufacturing (1st 1992 Toronto, Ont.)
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IC
author
International Conference on the Science and Technology of Defect Control in Semiconductors (1989 Yokohama-shi, Japan)
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IS
author
International Symposium on Defect Recognition and Image Processing in III-V Compounds (2nd 1987 Monterey, Calif.)
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IS
author
International Symposium on Defect Recognition and Image Processing in III-V Compounds (1985 Montpellier, France)
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SB
author
Symposium BB, "Defect Properties and Related Phenomena in Intermetallic Alloys" (2002 Boston, Mass.)
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DP
author
Defect Properties and Related Phenomena in intermetalli Symposium Bb
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IA
author
International Autumn Meeting "Gettering and Defect Engineering in Semiconductor Technology" (10th 2003 Seehotel Zeuthen, Germany)
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II
author
IEEE International Workshop on Defect Based Testing (2004 Napa, Calif.)
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IA
author
International Autumn Meeting "Gettering and Defect Engineering in Semiconductor Technology" (9th 2001 S. Tecla, Italy)
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II
author
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (18th 2003 Boston, Mass.)
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II
author
IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec)
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SA
author
Symposium A on Defect in Silicon, Hydrogen of the E-MRS Spring Conference (1998 Strasbourg, France)
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II
author
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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MI
author
Mass.) IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (18th : 2003 : Boston
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QI
author
Quebec) International Workshop on Defect and Fault Tolerance in VLSI Systems (1994 : Montreal
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D
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Def
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def
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D
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Defense
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CD
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C. Defee
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OD
author
O. Defeo
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DD
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Defense Defense
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D
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defeale
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DL
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Defen Li
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Defelice
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D
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Defender.
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DH
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Defen He
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DY
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Defen Yu
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D
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Defensor
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D
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DeFelice
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D
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Defebvre
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